SPM
Scanning probe microscope, SPM, Atomic Force Microscopy (AFM) provides the ability to image the surface topography of both conducting and insulating samples, as well as adsorbed molecules and nanoparticles
Bruker | Site
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Inna Popov
- innap@savion.huji.ac.il